X-ray texture analysis in materials and earth sciences
European Journal of Mineralogy Volume 9 Number 4 (1997), p. 735 - 762
published: Jul 23, 1997
manuscript received: Mar 21, 1995
ArtNo. ESP147050904007, Price: 29.00 €
Abstract The texture of a polycrystalline material is quantitatively defined by the orientation distribution function of the crystallites. In addition, higher-order textural quantities may also be considered such as the mis-orientation distribution function which describes the pair distribution of neighbouring crystals, texture fields, and multi-phase textures, thus approaching a comprehensive description of the statistical crystallography of polycrystalline aggregates. Textures of materials can be measured mainly by X-ray diffraction but also using neutron and electron diffraction. The original textural data are pole density distribution functions from which the orientation distribution function can be calculated. Textures have an influence on the properties of materials and they originate from all kinds of anisotrop solid-state processes. This establishes the interest in texture in materials science as well as in the earth sciences as illustrated by some examples.