A new tool to treat peak overlaps in electron-probe microanalysis of rare-earth-element L-series X-rays
Fialin, Michel; Outrequin, Michel; Staub, Pierre-Francois
European Journal of Mineralogy Volume 9 Number 5 (1997), p. 965 - 968
published: Sep 24, 1997
manuscript accepted: Mar 20, 1997
manuscript received: Nov 25, 1996
ArtNo. ESP147050905005, Price: 29.00 €
Abstract An empirical method for X-ray data processing is presented for the treatment of peak overlaps in electron-probe microanalysis. The performance of this method has been tested on the complex X-ray L-spectra of compounds containing rare-earth elements. The estimated minimum detection limits are better than 0.1 wt.% even in the presence of strong spectral interferences. The method can be easily included in computer software for on-line quantitative analysis. Most problems of peak interferences can thus be solved routinely with substantial reduction of time spent in the preparation of analytical session.