Original paper

A new tool to treat peak overlaps in electron-probe microanalysis of rare-earth-element L-series X-rays

Fialin, Michel; Outrequin, Michel; Staub, Pierre-Francois

European Journal of Mineralogy Volume 9 Number 5 (1997), p. 965 - 968

7 references

published: Sep 24, 1997
manuscript accepted: Mar 20, 1997
manuscript received: Nov 25, 1996

DOI: 10.1127/ejm/9/5/0965

BibTeX file

ArtNo. ESP147050905005, Price: 29.00 €

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Abstract An empirical method for X-ray data processing is presented for the treatment of peak overlaps in electron-probe microanalysis. The performance of this method has been tested on the complex X-ray L-spectra of compounds containing rare-earth elements. The estimated minimum detection limits are better than 0.1 wt.% even in the presence of strong spectral interferences. The method can be easily included in computer software for on-line quantitative analysis. Most problems of peak interferences can thus be solved routinely with substantial reduction of time spent in the preparation of analytical session.


electron microprobeLiF and PET monochromatorsoverlap standardrare-earth-element fluoridesmonazite