Beitrag
A quantitative analysis of stress using the polarizing microscope
Tippelt, Birgit; Paufler, Pater
Neues Jahrbuch für Mineralogie - Abhandlungen Band 163 Heft 1 (1991), p. 93 - 100
10 Literaturangaben
veröffentlicht: Aug 13, 1991
ArtNo. ESP154016301006, Preis: 29.00 €
Abstract
Long-range stress fields in cubic gallium phosphide, generated by mechanical load, are characterized quantitatively by their stress-induced birefringence images. The intensity of light in the image plane of the polarizing microscope is calculated taking into account the anisotropy of the piezooptical properties and the influence of the optical system. The computed intensity is compared with that obtained experimentally. The influence of the piezooptical anisotropy upon the isochromatic lines can both be calculated and obtained experimentally.
Schlagworte
Stress birefringence • Polarizing microscope